The semiconductor display industry is facing a severe winter, and companies need to use new technologies to further enhance production line capabilities. As a leader in the global panel display field, CSOT has an extreme pursuit in quality inspection. Traditional AOI (Automatic Optical Inspection) equipment can identify product defects and take automatic photos, but inspectors classify defects based on empirical rules, leading to challenges such as large bias fluctuations, low inspection efficiency, high labor intensity, and high human costs.
The AI Automatic Defect Classification System (ADC) developed by GCL Intelligent is the first truly implemented AI application in China's semiconductor display industry. The ADC system uses big data, AI deep learning, machine vision, and other latest technologies to compare product images with known defect image libraries. Through advanced algorithm models, it intelligently detects defect types, automatically analyzes anomalies, and provides solutions. By integrating this system with existing inspection processes, the solution can be quickly launched and operated.
