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Top Honor! Getech Dongzhi Wins First Prize in TCL R&D Again
2023-12-28
Recently, the annual TCL Technology Innovation Conference was held in Shenzhen. At the conference, the top honor in TCL R&D, the 'Technology Innovation Award', was announced. Getech Dongzhi won the 2022-2023 'TCL Technology Innovation First Prize' with the 'Tianjin Silicon Wafer Appearance AOI Inspection Machine'. This is the second time Getech Dongzhi has received this honor since 2022. In recent years, Getech Dongzhi has heavily invested in technology R&D in the semiconductor AOI field, continuously making breakthroughs in areas such as optics, image processing, and AI algorithms. The 'Tianjin Silicon Wafer Appearance AOI Inspection Machine' was jointly developed by Getech Dongzhi, TCL Industrial Research Institute, and Tianjin Leading, achieving tripartite collaboration in software, hardware, algorithms, and process know-how. It broke through five key technologies: automatic high-definition micron-level imaging, general anomaly detection (HGAD), large model local offline deployment, intelligent automated inspection, and real-time monitoring and warning. Its innovative optical system design, industry-leading precise defect detection, compatibility with various process products, ultra-high equipment yield, and tailored monitoring system are domestic firsts. Silicon wafers are important materials in semiconductor manufacturing, and detecting and evaluating surface quality issues is crucial. During preparation, silicon wafer appearance is prone to defects such as chemical residue, scratches, and cracks, which negatively impact downstream chip quality. Currently, silicon wafer appearance inspection mainly relies on experienced operators visually checking for defects, a method that suffers from strong subjectivity, low efficiency, and easy missed inspections, causing significant issues in industrial production. Using advanced AOI technology to achieve high-precision, high-efficiency detection of silicon wafer appearance defects has become a necessary means for the industry to reduce costs, increase efficiency, and improve product quality. Currently, related technologies incubated through the 'Tianjin Silicon Wafer Appearance AOI Inspection Machine' have been promoted and applied in manufacturing fields such as semiconductors, SIC, and photovoltaics, improving product quality while further reducing costs and enhancing production efficiency. In the future, Getech Dongzhi will further break through key AOI visual inspection technologies, innovate vigorously, and provide better intelligent services for related industry development.
