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GTRONTEC Semiconductor Wafer Manufacturing QMS Solution: Breaking through nanoscale quality control pain points, building an intelligent quality management system

2026-01-30

As semiconductor manufacturing advances toward 3nm and below processes, quality control has become a technical barrier determining the core competitiveness of fabs. Data shows that the quality cost (COQ) in fabs can account for 12%–18% of revenue. In this context, traditional quality management models struggle to meet the precision requirements of nanoscale manufacturing, making the construction of a QMS quality management system deeply integrated with semiconductor industry characteristics a critical need for wafer manufacturing companies to break through quality bottlenecks.


Four Major Quality Challenges in Semiconductor Wafer Manufacturing


Difficulty in Nanoscale Process Monitoring

Semiconductor wafer manufacturing involves hundreds of critical processes such as lithography, etching, and thin-film deposition, each requiring nanoscale precision control. Traditional manual monitoring struggles to meet the high-precision, high-frequency requirements for process stability.

Fragmented Multi-Stage Quality Traceability

From raw material input to wafer testing completion, the production cycle spans 8–12 weeks, involving over 200 process nodes. Under traditional management models, quality data is scattered across paper records in various stages. Once batch defects occur, traceability cycles typically exceed 72 hours.

Challenges in Supplier Quality Collaborative Management

Critical materials like photoresists and targets for wafer manufacturing involve over 500 global suppliers. However, due to the lack of quality information sharing and collaborative platforms, supplier quality improvement cycles average 45 days, significantly impacting production ramp-up.

Quality Data Silos Hinder Decision-Making

Fabs typically deploy 10+ information systems such as MES, ERP, and EAP, generating over 50GB of quality-related data daily. However, due to data fragmentation, 85% of quality data remains unused, affecting the comprehensiveness and accuracy of quality decisions.




Semiconductor Wafer Manufacturing QMS Solution


GTRONTEC deeply integrates semiconductor industry know-how and quality digital transformation experience to provide semiconductor wafer manufacturing companies with a QMS solution covering multiple key areas such as process parameter monitoring, end-to-end quality traceability, supplier collaborative management, and quality data integration analysis, building a comprehensive and intelligent quality management platform for enterprises.




(I) Comprehensive Process Parameter Monitoring and Control

Real-Time Data Collection: Deploy high-precision sensors and inspection equipment at key process stages of wafer manufacturing to collect real-time process parameters such as temperature, pressure, flow rate, gas purity, and photoresist thickness, ensuring data timeliness, accuracy, and completeness.

Statistical Process Control (SPC) Application: Utilize SPC technology to analyze collected process parameters in real time, creating control charts to monitor process stability. When parameters exceed control limits, the system automatically triggers alerts and notifies relevant personnel for timely adjustments, preventing batch quality issues and reducing wafer losses due to process variations.

Process Parameter Optimization: Through in-depth analysis of historical process data and integration with AI algorithms and expert knowledge, continuously optimize process parameter settings to improve process stability and product yield.


(II) End-to-End Quality Traceability System

Unique Identification and Data Association: Assign a unique identifier to each wafer throughout the entire production process. At each stage, associate process parameters, equipment information, operators, and raw material batch data with the wafer identifier to establish a comprehensive quality database.

Rapid and Precise Traceability: In case of quality issues, the QMS system's traceability function quickly locates the affected wafer's production batch, raw materials used, process steps, equipment, and related operators, enabling precise root cause analysis and supporting effective corrective actions to minimize impact and loss costs.

Quality Performance Analysis: Based on end-to-end traceability data, perform multi-dimensional analysis and evaluation of quality performance across production stages, equipment, raw material suppliers, and operators to identify weak links and key influencing factors, providing a basis for quality improvement decisions.


(III) Supplier Quality Management Collaborative Platform

Supplier Qualification Assessment: Establish stringent supplier qualification standards and evaluation processes, conducting comprehensive assessments across dimensions such as quality management systems, production processes, equipment capabilities, historical product quality performance, delivery times, and pricing to ensure collaboration with high-quality, reliable suppliers.

Real-Time Quality Information Sharing: Through the QMS collaborative platform, enable real-time quality information sharing with suppliers. Suppliers can promptly access inspection results, usage feedback, and quality reports of their materials within the enterprise, while the company can track and supervise supplier quality improvement measures, fostering continuous product quality enhancement.

Joint Quality Improvement: Regularly hold quality review meetings with suppliers to collaboratively address raw material quality issues. For suppliers with frequent quality problems, initiate joint improvement projects, providing technical support and training to help suppliers enhance their quality management capabilities, achieving win-win development.


(IV) Quality Data Integration and Intelligent Analysis Decision Center

System Integration and Data Consolidation: Fully integrate QMS with internal systems like MES, ERP, and EAP to break down data silos and enable seamless quality data flow and sharing across systems. Through unified data standards and interface specifications, consolidate quality data from different systems to form an enterprise-wide quality big data platform.

Big Data Analysis and Mining: Employ big data analytics, machine learning algorithms, and AI models to deeply mine and analyze vast quality data. For example, use association rule mining to uncover potential relationships between process parameters and product defects, or apply clustering analysis to classify and predict product quality, providing comprehensive and in-depth quality insights.

Intelligent Decision Support: Based on data analysis results, provide management with intuitive, real-time quality reports, dashboards, and decision-support tools. Through data visualization techniques, present complex data in easily understandable charts, helping management quickly grasp the enterprise's quality status and make scientifically sound decisions, such as production plan adjustments, resource allocation optimization, and quality improvement measures.




Semiconductor Wafer Manufacturing QMS Case Studies


Case 1

A leading domestic 12-inch chip manufacturer (annual capacity exceeding 500,000 wafers) implemented GTRONTEC's QMS solution, which deeply integrates semiconductor industry experience with IATF 16949 standards. Core modules were delivered in 20 days, enabling the company to completely transition from traditional paper-based management to online, standardized quality management, improving processing efficiency by over 30% and data utilization by over 50%.


Case 2

A 12-inch front-end fab, after successfully deploying GTRONTEC's QMS solution, achieved approximately 15% improvement in engineering change and shipping efficiency through functions like engineering change management, shipment management, measurement analysis, and FMEA management. Measurement management reduced equipment-related losses by about 100,000 RMB annually, while FMEA and continuous improvement efforts cut quality issue losses by approximately 50,000 RMB per year.


Quality is competitiveness. GTRONTEC's semiconductor wafer manufacturing QMS solution drives fabs to shift from "post-inspection" to "preventive action" and from "quality control" to "quality creation" through intelligent process monitoring, end-to-end traceability, supply chain collaboration, and data-driven decision-making. By deeply integrating semiconductor industry characteristics with quality digitalization technologies, it helps Chinese wafer manufacturers build a formidable quality moat in the nanoscale precision competition.




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