50+ Case Studies! Getech SPC Makes Processes Speak, Uses Data for Decisions, Strengthens Semiconductor Quality Foundation
In the precision workshops of wafer fabs and advanced packaging and testing bases, the flow of each silicon wafer, the parameters of each lithography exposure, and the subtle changes in each etching process are transmitting the 'voice of the process' in real time.Getech SPC has brought quantitative value in yield improvement, cost reduction, and customer trust to over 50 semiconductor companies.
PDCA Full Process Closed Loop:
Quality Control Logic from Data to Decision
Statistical Process Control (SPC) is a quality method that monitors and manages the production process through statistical techniques. Its core wisdom lies in upgrading the passive mode of 'post-inspection' to the active control of 'process prevention', by real-time monitoring of quality characteristic data, distinguishing normal fluctuations from abnormal variations, issuing warnings before defects occur, achieving 'prevention before it happens'.
Semiconductor manufacturing, with its ultra-precision, high complexity, and multi-process linkage characteristics, imposes extreme demands on quality control. Getech SPC deeply aligns with industry characteristics, building a completePDCA cycle of 'data collection → monitoring analysis → warning linkage → abnormal handling → continuous improvement':
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Downward integration of real-time data from machine sensors, measurement equipment, factory systems, etc., to achieve full-element quality data access;
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Upward linkage with MES (Manufacturing Execution System), EAP (Equipment Automation Program), QMS (Quality Management System), forming a closed-loop chain for abnormal handling;
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Making every process parameter a traceable, analyzable, and optimizable quality basis.
